Tin in solder or some other meals can form spiky crystals when under stress. These whiskers can form short circuits if not properly insulated or not alloyed with other metals.
Tin in solder or some other meals can form spiky crystals when under stress. These whiskers can form short circuits if not properly insulated or not alloyed with other metals.
Does electromigration move the dopant?
Check out https://en.wikipedia.org/wiki/Hot-carrier_injection hot carrier degredation, it’s in the vicinity of electron mobility but in a semiconductor setting. Key link is it’s electrons with momentum doing the work. In this case electrons (much hotter than in electron mobility, which are limited by the saturation velocity) smash into the gate dielectric, making it a worse dielectric. Hot carrier injection doesn’t have to end in damage to the dielectric, but when it does it’s hot carrier degredation. There’s a lot going on though, semiconductors are really complex - like electron tunneling also exists.
Electromigration in ICs typically occurs in metal interconnect, so there are no dopants there to move. Dopants are added to the silicon substrate.
I’ll have to look this up cause now I have like three more questions. Thanks!